Product Profile of Surface Profiler With Multiple Language Support

Surface Profiler with Multiple Language Support is ideal for semiconductor pilot lines and materials research and enables faster process learning and higher yields. The Surface Profiler provides advanced and customizable 2D surface profiling analysis capabilities. The Surface Profiler enables easy location of measurement features via saved site image with recipe. Surface Profiler with Multiple Language Support features excellent surface profiling process repeatability and reproducibility.

Key Features of Surface Profiler With Multiple Language Support

• Ideal for ideal for semiconductor pilot lines and materials research
• Provides advanced and customizable 2D surface profiling analysis capabilities
• Enables easy location of measurement features via saved site image with recipe
• Features excellent surface profiling process repeatability and reproducibility
• Precisely determines and analyzes thin step heights, surface micro roughness, and overall form error on thin film surface coatings
• Provides sufficient vertical range for large topography variations
• Includes multiple language support for users with a worldwide presence
• Enables faster surface profiling analysis routines by applying saved sets of analysis instructions